Abstract:The “Fuji”apples were taken as research object，the nondestructive detection of defect on apples was proposed based on hyperspectral imaging technology combined with image segmentation technology.And the hyperspectral imaging system was used to collect the hyperspectral image of apples with no defect and surface defect.After the minimum noise fraction（MNF）transform，the average spectral reflectance of the region of interest（ROI）was acquired.The nondestructive detection of defect on apples was proposed based on image segmentation technology and then applied on 80 no defect apples and 40 surface defect apples.Results showed that the noise of the hyperspectral image of apples can be effectively removed by MNF transform.And the no defect apples and surface defect apples had obvious reflectance value between 700 nm-800 nm and 900 nm-1 000 nm.The spectral reflectance at 717.98 nm was less than 0.6 and the spectral reflectance at 982.59 nm was greater than 0.52，which were both selected as the threshold condition to distinguish the normal region and the surface defect region of apples.The correct identification rates for no defect apples and surface defect apples reached to 97.5%and 95%，respectively.This study indicated that hyperspectral imaging technology combined with image segmentation technology was effective for identifying defect on apples.